I will plot and analyze xrd data using origin lab software

D
dr_lucky03
D
dr_lucky03
Lucky Sharma
plot and analyze xrd data using origin lab software
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plot and analyze xrd data using origin lab software
Full Screen
Full Screen
plot and analyze xrd data using origin lab softwareplot and analyze xrd data using origin lab softwareplot and analyze xrd data using origin lab software

About this gig

Are you looking for accurate and publication-ready XRD analysis?

I am a PhD in Physics with expertise in X-ray diffraction (XRD) analysis, Rietveld refinement, and data modeling using Origin. I help researchers, students, and professionals convert raw experimental data into meaningful scientific results.

My Services Include:

XRD data plotting (high-quality graphs)

Peak identification and hkl indexing

Crystallite size calculation (Scherrer method)

WilliamsonHall analysis (size and strain)

Rietveld refinement

Phase identification

Publication-ready figures and results

Why choose me?

PhD-level expertise

Accurate and reliable analysis

Clear communication and fast response

High-quality graphs and reports

What I need from you:

Your XRD data file (Excel, .txt, or .raw)

Any specific requirements (if applicable)

Note:

Please contact me before placing an order to discuss your requirements.

Lets work together to turn your data into impactful scientific results.

  • Tool

    • Other

  • Chart type

    • Comparison
    • Distribution
    • Patterns
    • Range

Get to know Lucky Sharma

Lucky Sharma

PhD Physics, XRD, SEM, FESEM AFM, UV, PL Analysis Expert

  • FromIndia
  • Member sinceMay 2026
  • Avg. response time1 hour

  • Languages

    Hindi, English
I am a PhD in Physics from the University of Delhi and a data analysis and materials characterization specialist with expertise in OriginLab and Python. I help researchers and students convert raw experimental data into accurate, publication-ready results. I have experience in XRD, SEM/FESEM, AFM, UV, and PL analysis, including crystallite size, Rietveld refinement, peak fitting, phase identification, particle size analysis, histogram distribution, line profile, and surface roughness. I am committed to accuracy, clarity, and timely delivery.